A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes

Published 2011 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes
Authors
Keywords
-
Journal
EXPERT SYSTEMS WITH APPLICATIONS
Volume 39, Issue 3, Pages 2590-2596
Publisher
Elsevier BV
Online
2011-08-30
DOI
10.1016/j.eswa.2011.08.114

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.