EGaIn Microelectrode for Electrical Characterization of ITO-Based van der Waals Interface and Airborne Molecular Contamination of ITO Surface

Published 2015 View Full Article

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Title
EGaIn Microelectrode for Electrical Characterization of ITO-Based van der Waals Interface and Airborne Molecular Contamination of ITO Surface
Authors
Keywords
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Journal
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume 162, Issue 9, Pages H703-H712
Publisher
The Electrochemical Society
Online
2015-07-09
DOI
10.1149/2.0871509jes

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