Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum × Gossypium barbadense) based on RGA-AFLP analysis

Title
Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum × Gossypium barbadense) based on RGA-AFLP analysis
Authors
Keywords
Tetraploid cotton, Verticillium wilt resistance, Linkage map, Backcross inbred lines, Quantitative trait loci (QTL)
Journal
EUPHYTICA
Volume 194, Issue 1, Pages 79-91
Publisher
Springer Nature
Online
2013-06-22
DOI
10.1007/s10681-013-0965-4

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now