Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dTcrossing a single thermally induced pH junction in a BGE with high dpH/dT
Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dTcrossing a single thermally induced pH junction in a BGE with high dpH/dT
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationAdd your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload Now