4.3 Article

High-resolution imaging of defects in CdTe solar cells using thermoreflectance

Journal

ELECTRONICS LETTERS
Volume 49, Issue 24, Pages 1559-1560

Publisher

INST ENGINEERING TECHNOLOGY-IET
DOI: 10.1049/el.2013.1884

Keywords

cadmium compounds; II-VI semiconductors; point defects; solar cells; thermoreflectance; thermoreflectance; thermal imaging; nonuniform operation; point defects; cell efficiency; infrared light; superstrate cells; glass substrate; light transmission; lock-in technique; visible light; spatial resolution; imaging wavelength; resistive shunt; CdTe

Funding

  1. Center for Hierarchical Manufacturing at the University of Massachusetts Amherst
  2. NSF [CMMI-1025020]

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Thermal imaging of solar cells is important for diagnosing non-uniform operation or point defects, which can reduce cell efficiency. However, imaging with infrared light is impractical for superstrate CdTe cells because the glass substrate blocks transmission of light. It is shown that thermoreflectance - a lock-in technique that detects changes in the reflectivity of visible light - can circumvent this problem and achieve thermal images with spatial resolution limited only by the imaging wavelength. The diagnostic is used to show that a particular defect is a resistive shunt.

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