ISFET threshold voltage programming in CMOS using hot-electron injection

Published 2009 View Full Article

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Title
ISFET threshold voltage programming in CMOS using hot-electron injection
Authors
Keywords
-
Journal
ELECTRONICS LETTERS
Volume 45, Issue 22, Pages 1112
Publisher
Institution of Engineering and Technology (IET)
Online
2009-10-22
DOI
10.1049/el.2009.2310

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