Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics

Title
Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 48, Issue 19, Pages 195204
Publisher
IOP Publishing
Online
2015-04-08
DOI
10.1088/0022-3727/48/19/195204

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