Bolometric properties of reactively sputtered TiO2−xfilms for thermal infrared image sensors

Title
Bolometric properties of reactively sputtered TiO2−xfilms for thermal infrared image sensors
Authors
Keywords
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Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 48, Issue 35, Pages 355104
Publisher
IOP Publishing
Online
2015-08-06
DOI
10.1088/0022-3727/48/35/355104

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