Quantifying the Extent of Contact Doping at the Interface between High Work Function Electrical Contacts and Poly(3-hexylthiophene) (P3HT)

Published 2015 View Full Article

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Title
Quantifying the Extent of Contact Doping at the Interface between High Work Function Electrical Contacts and Poly(3-hexylthiophene) (P3HT)
Authors
Keywords
-
Journal
Journal of Physical Chemistry Letters
Volume 6, Issue 8, Pages 1303-1309
Publisher
American Chemical Society (ACS)
Online
2015-03-24
DOI
10.1021/acs.jpclett.5b00444

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