Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films

Published 2015 View Full Article

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Title
Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 119, Issue 21, Pages 11958-11964
Publisher
American Chemical Society (ACS)
Online
2015-05-06
DOI
10.1021/acs.jpcc.5b01672

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