Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex

Published 2015 View Full Article

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Title
Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex
Authors
Keywords
-
Journal
JOURNAL OF NEUROSCIENCE
Volume 35, Issue 50, Pages 16450-16462
Publisher
Society for Neuroscience
Online
2015-12-17
DOI
10.1523/jneurosci.1573-15.2015

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