Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae

Title
Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae
Authors
Keywords
Atomic force microscopy (AFM), <em class=EmphasisTypeItalic >Saccharomyces cerevisiae</em>, Cell surface, Cell wall, Stress, Cellular sensors, Antifungal agents
Journal
CURRENT GENETICS
Volume 59, Issue 4, Pages 187-196
Publisher
Springer Nature
Online
2013-09-26
DOI
10.1007/s00294-013-0411-0

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