Transmission electron microscopy without aberrations: Applications to materials science

Title
Transmission electron microscopy without aberrations: Applications to materials science
Authors
Keywords
-
Journal
CURRENT APPLIED PHYSICS
Volume 8, Issue 3-4, Pages 425-428
Publisher
Elsevier BV
Online
2007-12-04
DOI
10.1016/j.cap.2007.10.065

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