Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission

Title
Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission
Authors
Keywords
Raman Spectroscopy, Crystallography Report, Graphene Layer, Thickness Estimation, Scanning Tunnelling Micro
Journal
CRYSTALLOGRAPHY REPORTS
Volume 58, Issue 7, Pages 1053-1057
Publisher
Pleiades Publishing Ltd
Online
2013-12-27
DOI
10.1134/s1063774513070195

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