Journal
CRYSTALLOGRAPHY REPORTS
Volume 56, Issue 4, Pages 650-661Publisher
MAIK NAUKA/INTERPERIODICA/SPRINGER
DOI: 10.1134/S1063774511040079
Keywords
-
Categories
Ask authors/readers for more resources
The potential of high-resolution transmission electron microscopy (including the quantitative computer processing of images and computer simulation) in a local analysis of nanomaterials is discussed. A number of examples of the application of fast Fourier transform and simulated high-resolution electronmicroscopy images in the identification of nanophases and the crystallographic study of nanocrystals and nanoparticles are considered. The role that B.K. Vainshtein played in the development of a unified approach for determination of the structure of materials using short-wave diffraction is indicated.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available