Influence of grain boundaries intentionally induced between seed plates on the defect generation in quasi-mono-crystalline silicon ingots

Published 2014 View Full Article

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Title
Influence of grain boundaries intentionally induced between seed plates on the defect generation in quasi-mono-crystalline silicon ingots
Authors
Keywords
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Journal
CRYSTAL RESEARCH AND TECHNOLOGY
Volume 50, Issue 1, Pages 124-132
Publisher
Wiley
Online
2014-08-18
DOI
10.1002/crat.201400226
References
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