Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy

Published 2009 View Full Article

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Title
Native oxidation of sputter deposited polycrystalline copper thin films during short and long exposure times: Comparative investigation by specular and non-specular grazing incidence X-ray absorption spectroscopy
Authors
Keywords
-
Journal
CORROSION SCIENCE
Volume 52, Issue 4, Pages 1305-1316
Publisher
Elsevier BV
Online
2009-12-12
DOI
10.1016/j.corsci.2009.12.012

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