4.8 Article

Characterizing the Metal - SAM Interface in Tunneling Junctions

Journal

ACS NANO
Volume 9, Issue 2, Pages 1471-1477

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nn5059216

Keywords

charge transport; EGain; molecular electronics; alkynes; self-assembled monolayer

Funding

  1. Northwestern University from the United States Department of Energy (DOE) [DE-SC0000989]
  2. National Science Centre Poland [DEC-2013/10/E/ST5/00060]
  3. DOE grant from Northwestern
  4. Cyberdiscovery Initiative Type II (CDI2) grant from the National Science Foundation (NSF) [OIA-1125087]
  5. National Science Foundation [ECS-0335765]
  6. Office Of The Director
  7. Office of Integrative Activities [1125087] Funding Source: National Science Foundation

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This paper investigates the influence of the interface between a gold or silver metal electrode and an n-alkyl SAM (supported on that electrode) on the rate of charge transport across junctions with structure Met(Au or Ag)(TS)/A(CH2)(n)H//Ga2O3/EGaIn by comparing measurements of current density, J(V), for Met/AR = Au/thiolate (Au/SR), Ag/thiolate (Ag/SR), Ag/carboxylate (Ag/O2CR), and Au/acetylene (Au/C equivalent to CR), where R is an n-alkyl group. Values of J(0) and beta (from the Simmons equation) were indistinguishable for these four interfaces. Since the anchoring groups, A, have large differences in their physical and electronic properties, the observation that they are indistinguishable in their influence on the injection current, J(0) (V = 0.5) indicates that these four Met/A interfaces do not contribute to the shape of the tunneling barrier in a way that influences J(V).

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