Measurements of screening length in salt solutions by total internal reflection microscopy: Influence of van der Waals forces and instrumental noise

Title
Measurements of screening length in salt solutions by total internal reflection microscopy: Influence of van der Waals forces and instrumental noise
Authors
Keywords
-
Publisher
Elsevier BV
Online
2013-04-07
DOI
10.1016/j.colsurfa.2013.03.058

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