Characterization of natural and manufactured nanoparticles by atomic force microscopy: Effect of analysis mode, environment and sample preparation

Title
Characterization of natural and manufactured nanoparticles by atomic force microscopy: Effect of analysis mode, environment and sample preparation
Authors
Keywords
-
Publisher
Elsevier BV
Online
2012-12-12
DOI
10.1016/j.colsurfa.2012.12.004

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