Definitive Molecular Level Characterization of Defects in UiO-66 Crystals

Title
Definitive Molecular Level Characterization of Defects in UiO-66 Crystals
Authors
Keywords
-
Journal
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
Volume 54, Issue 38, Pages 11162-11167
Publisher
Wiley
Online
2015-08-28
DOI
10.1002/anie.201505461

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now