Characterization of the Surface Properties of Commercially Available Dental Implants Using Scanning Electron Microscopy, Focused Ion Beam, and High-Resolution Transmission Electron Microscopy

Published 2007 View Full Article

Authors

Keywords

Journal

Clinical Implant Dentistry and Related Research

Volume 10, Issue 1, Pages 11-22

Publisher

Wiley

Online

2007-11-21

DOI

10.1111/j.1708-8208.2007.00056.x

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Clinical Implant Dentistry and Related Research

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