Quantum Optical Technologies for Metrology, Sensing, and Imaging

Title
Quantum Optical Technologies for Metrology, Sensing, and Imaging
Authors
Keywords
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Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 33, Issue 12, Pages 2359-2370
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-12-31
DOI
10.1109/jlt.2014.2386795

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