Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly
Authors
Keywords
-
Journal
ACS Nano
Volume 9, Issue 6, Pages 5760-5771
Publisher
American Chemical Society (ACS)
Online
2015-05-13
DOI
10.1021/nn507493s

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.