Impact of Interfacial Trap Density of States on the Stability of Amorphous InGaZnO-Based Thin-Film Transistors

Published 2012 View Full Article

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Title
Impact of Interfacial Trap Density of States on the Stability of Amorphous InGaZnO-Based Thin-Film Transistors
Authors
Keywords
-
Journal
CHINESE PHYSICS LETTERS
Volume 29, Issue 6, Pages 067302
Publisher
IOP Publishing
Online
2012-06-12
DOI
10.1088/0256-307x/29/6/067302

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