Thermal Conductivity Measurement of Submicron-Thick Aluminium Oxide Thin Films by a Transient Thermo-Reflectance Technique

Published 2008 View Full Article

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Title
Thermal Conductivity Measurement of Submicron-Thick Aluminium Oxide Thin Films by a Transient Thermo-Reflectance Technique
Authors
Keywords
-
Journal
CHINESE PHYSICS LETTERS
Volume 25, Issue 2, Pages 593-596
Publisher
IOP Publishing
Online
2008-02-20
DOI
10.1088/0256-307x/25/2/065

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