Correlative Atomic Force Microscopy and Localization-Based Super-Resolution Microscopy: Revealing Labelling and Image Reconstruction Artefacts
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Title
Correlative Atomic Force Microscopy and Localization-Based Super-Resolution Microscopy: Revealing Labelling and Image Reconstruction Artefacts
Authors
Keywords
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Journal
CHEMPHYSCHEM
Volume 15, Issue 4, Pages 647-650
Publisher
Wiley
Online
2013-11-25
DOI
10.1002/cphc.201300853
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