Air Stable Cross-Linked Cytop Ultrathin Gate Dielectric for High Yield Low-Voltage Top-Gate Organic Field-Effect Transistors

Title
Air Stable Cross-Linked Cytop Ultrathin Gate Dielectric for High Yield Low-Voltage Top-Gate Organic Field-Effect Transistors
Authors
Keywords
-
Journal
CHEMISTRY OF MATERIALS
Volume 22, Issue 4, Pages 1559-1566
Publisher
American Chemical Society (ACS)
Online
2010-01-22
DOI
10.1021/cm902929b

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