Morphology of perylene thin films on SiOx/Si(100) and SiO2/Si(100): A spectroscopic and microscopic study of the influence of the preparation parameters

Published 2009 View Full Article

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Title
Morphology of perylene thin films on SiOx/Si(100) and SiO2/Si(100): A spectroscopic and microscopic study of the influence of the preparation parameters
Authors
Keywords
-
Journal
CHEMICAL PHYSICS LETTERS
Volume 479, Issue 1-3, Pages 76-80
Publisher
Elsevier BV
Online
2009-08-12
DOI
10.1016/j.cplett.2009.08.015

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