Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale

Published 2008 View Full Article

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Keywords

Journal

CHEMICAL GEOLOGY

Volume 261, Issue 3-4, Pages 217-229

Publisher

Elsevier BV

Online

2008-06-12

DOI

10.1016/j.chemgeo.2008.05.019

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CHEMICAL GEOLOGY

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