Principle and application of low energy inverse photoemission spectroscopy: A new method for measuring unoccupied states of organic semiconductors

Published 2015 View Full Article

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Title
Principle and application of low energy inverse photoemission spectroscopy: A new method for measuring unoccupied states of organic semiconductors
Authors
Keywords
Low-energy inverse photoemission spectroscopy, Unoccupied state, Electron affinity, Organic semiconductor
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 204, Issue -, Pages 116-124
Publisher
Elsevier BV
Online
2015-07-14
DOI
10.1016/j.elspec.2015.07.003

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