Characterizing morphology in organic systems with resonant soft X-ray scattering

Published 2015 View Full Article

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Title
Characterizing morphology in organic systems with resonant soft X-ray scattering
Authors
Keywords
Scattering, Soft X-ray, Resonant scattering, Morphology characterization, Organic thin films, Organic electronics, Soft matter, Block copolymers
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 200, Issue -, Pages 2-14
Publisher
Elsevier BV
Online
2015-05-20
DOI
10.1016/j.elspec.2015.05.006

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