Structural and Electrical Characteristics of $\hbox{Yb}_{2}\hbox{O}_{3}$ and $\hbox{YbTi}_{\rm x}\hbox{O}_{\rm y}$ Gate Dielectrics for $\alpha$-InGaZnO Thin-Film Transistors

Title
Structural and Electrical Characteristics of $\hbox{Yb}_{2}\hbox{O}_{3}$ and $\hbox{YbTi}_{\rm x}\hbox{O}_{\rm y}$ Gate Dielectrics for $\alpha$-InGaZnO Thin-Film Transistors
Authors
Keywords
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Journal
Journal of Display Technology
Volume 11, Issue 3, Pages 248-254
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-12-26
DOI
10.1109/jdt.2014.2380453

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