Establishment of Element Fingerprint and Multielement Analysis of Fritillaria thunbergii by Inductively Coupled Plasma Optical Emission Spectrometry

Element fingerprints were deciphered for Fritillaria thunbergii from Chinese ten major fritillaria-producing regions for the purpose of examining differences in element composition with region of origin and identifying elements' importance to F. thunbergii. Analysis by inductively coupled plasma optical emission spectrometry allowed simultaneous determination of 18 elements in F. thunbergii (Al, B, Ca, Cd, Co, Cr, Cu, Fe, K, Mg, Na, Mn, Mo, S, Ni, P, Pb, and Zn), and patterns in element concentrations were deciphered by principle component analysis (PCA) and hierarchical cluster analysis (HCA). The element fingerprint was established which well reflected the element characteristics of F. thunbergii. Meanwhile, the ten regions were discriminated with 100% accuracy using HCA and PCA based on 18 of these elements. The element Mg, Ca, K, B, P, Mo, Na, Cd, Ni, and Al were viewed as the characteristic element of F. thunbergii, and the fingerprint of these elements could be used to distinguish the authenticity of F. thunbergii Miq.