Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis

Title
Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 117, Issue 5, Pages 055501
Publisher
AIP Publishing
Online
2015-02-04
DOI
10.1063/1.4907213

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started