Tests of the modified Sigmund model of ion sputtering using Monte Carlo simulations
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Title
Tests of the modified Sigmund model of ion sputtering using Monte Carlo simulations
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 117, Issue 17, Pages 174310
Publisher
AIP Publishing
Online
2015-05-08
DOI
10.1063/1.4919826
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Note: Only part of the references are listed.- Model for roughening and ripple instability due to ion-induced mass redistribution [Addendum to H. Hofsäss, Appl. Phys. A 114 (2014) 401, “Surface instability and pattern formation by ion-induced erosion and mass redistribution”]
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- Crater function approach to ion-induced nanoscale pattern formation: Craters for flat surfaces are insufficient
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- Propagation of ripple patterns on Si during ion bombardment
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- (2012) Omar Bobes et al. PHYSICAL REVIEW B
- Ion impact crater asymmetry determines surface ripple orientation
- (2011) M. Z. Hossain et al. APPLIED PHYSICS LETTERS
- Ripple formation on atomically flat cleaved Si surface with roughness of 0.038 nm rms by low-energy Ar1+ ion bombardment
- (2011) Shahjada A. Pahlovy et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Molecular dynamics of single-particle impacts predicts phase diagrams for large scale pattern formation
- (2011) Scott A. Norris et al. Nature Communications
- Ion-Induced Nanoscale Ripple Patterns on Si Surfaces: Theory and Experiment
- (2010) Adrian Keller et al. Materials
- Linear stability and instability patterns in ion-sputtered silicon
- (2009) Charbel S Madi et al. JOURNAL OF PHYSICS-CONDENSED MATTER
- A multiscale crater function model for ion-induced pattern formation in silicon
- (2009) N Kalyanasundaram et al. JOURNAL OF PHYSICS-CONDENSED MATTER
- Single impact crater functions for ion bombardment of silicon
- (2008) N. Kalyanasundaram et al. APPLIED PHYSICS LETTERS
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