Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
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Title
Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 118, Issue 9, Pages 095302
Publisher
AIP Publishing
Online
2015-09-04
DOI
10.1063/1.4929874
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