Studies of compositional dependent Cu2Zn(GexSn1−x)S4 thin films prepared by sulfurizing sputtered metallic precursors

Authors

Keywords

Cu, 2, Zn(Ge, , Sn, 1, −, , )S, 4, thin film, Magnetron sputtering, Element loss, Lattice parameter, Raman, XRD

Journal

Volume 621, Issue -, Pages 154-161

Publisher

Elsevier BV

Online

2014-09-22

DOI

10.1016/j.jallcom.2014.09.097

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