Determination of Schottky barrier heights and Fermi-level unpinning at the graphene/n-type Si interfaces by X-ray photoelectron spectroscopy and Kelvin probe

Published 2014 View Full Article

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Title
Determination of Schottky barrier heights and Fermi-level unpinning at the graphene/n-type Si interfaces by X-ray photoelectron spectroscopy and Kelvin probe
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 322, Issue -, Pages 225-229
Publisher
Elsevier BV
Online
2014-10-28
DOI
10.1016/j.apsusc.2014.10.062

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