Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

Published 2013 View Full Article

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Title
Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 274, Issue -, Pages 405-417
Publisher
Elsevier BV
Online
2013-01-06
DOI
10.1016/j.apsusc.2012.12.143

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