4.7 Article

Characterisation of samarium and nitrogen co-doped TiO2 films prepared by chemical spray pyrolysis

Journal

APPLIED SURFACE SCIENCE
Volume 261, Issue -, Pages 735-741

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2012.08.090

Keywords

TiO2 thin films; Doping; Chemical spray pyrolysis; XPS; AFM; Photoluminescence

Funding

  1. Estonian Ministry of Education and Research [SF0140092s08]
  2. Estonian Science Foundation [ETF7788, ETF8699, ETF7456]
  3. European Union [3.2.0101.11-0029, 3.2.1101.12-002]

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The sol-gel chemical spray pyrolysis method was used to deposit samarium and nitrogen co-doped TiO2 films onto a quartz substrate at a growth temperature of 450 degrees C using pulsed spray solution feed, followed by annealing at 500 degrees C for 2 h in air. The obtained films exhibited anatase structure independent of the doping level. According to XRD analysis, the mean crystallite size of the undoped TiO2, TiO2: N(25) and TiO2: N(5): Sm(5) films was 32, 38 and 20 nm, respectively. According to AFM, the undoped TiO2 film consisted of agglomerates with a size of 30-200 nm. N-doping (25 at%) transformed the agglomerates into individually distinctive grains with a size of ca. 30 nm, while Sm doping (5 at%) caused a significant decrease in the average diameter of the agglomerates to ca. 100 nm. The RMS roughness of the undoped TiO2 film was 1.7 nm; doping resulted in the formation of smoother films with RMS roughness of 0.9-1.4 nm. XPS data indicated that the Sm and N dopants were incorporated into the TiO2 crystal lattice and/or adsorbed on the surface of the film. An increasing nitrogen concentration in the spray solution correlates to a systematic suppressing of the photoluminescence intensity of Sm3+. (C) 2012 Elsevier B. V. All rights reserved.

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