Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

Published 2012 View Full Article

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Title
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 258, Issue 21, Pages 8354-8359
Publisher
Elsevier BV
Online
2012-04-05
DOI
10.1016/j.apsusc.2012.03.172

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