Characterization of single-crystalline In2O3 films deposited on Y-stabilized ZrO2 (100) substrates by MOCVD

Published 2010 View Full Article

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Title
Characterization of single-crystalline In2O3 films deposited on Y-stabilized ZrO2 (100) substrates by MOCVD
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 257, Issue 2, Pages 518-522
Publisher
Elsevier BV
Online
2010-07-17
DOI
10.1016/j.apsusc.2010.07.024

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