Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides

Title
Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 254, Issue 16, Pages 5141-5148
Publisher
Elsevier BV
Online
2008-02-12
DOI
10.1016/j.apsusc.2008.02.003

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