4.6 Article

Dual-Wavelength Y-Branch Distributed Bragg Reflector Diode Laser at 785 Nanometers for Shifted Excitation Raman Difference Spectroscopy

Journal

APPLIED SPECTROSCOPY
Volume 68, Issue 8, Pages 838-843

Publisher

SOC APPLIED SPECTROSCOPY
DOI: 10.1366/13-07331

Keywords

Distributed Bragg reflector; DBR diode laser; Raman spectroscopy; Y-branch; 785 nm; Shifted excitation Raman difference spectroscopy; SERDS

Funding

  1. Federal Ministry of Education and Research (BMBF) in the program Validierung des Innovationspotenzials wissenschaftlicher Forschung-VIP [03V0207]

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A dual-wavelength Y-branch distributed Bragg reflector (DBR) diode laser at 785 nm is presented as an excitation light source for shifted excitation Raman difference spectroscopy (SERDS). The monolithic device was realized with deeply etched surface DBR gratings using one-step epitaxy. An optical output power of 140 mW was obtained in continuous-wave (CW) operation for each laser cavity, with emission wavelengths of the device at 784.50 and 785.12 nm. A spectral width of the laser emission of 30 pm (0.5 cm(-1)), including 95% of optical power, was measured. The mean spectral distance of both excitation lines is 0.63 nm (10.2 cm(-1)) over the whole operating range. Raman experiments using polystyrene as the test sample and ambient light as the interference source were carried out and demonstrate the suitability of the dual-wavelength diode laser for SERDS.

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