Journal
APPLIED RADIATION AND ISOTOPES
Volume 67, Issue 7-8, Pages 1324-1331Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.apradiso.2009.02.069
Keywords
Radionuclide production; Targetry; Cyclotron radioisotope; Cu-64; Ion exchange chromatography; Gradient elution
Ask authors/readers for more resources
The method for (CU)-C-64 production based on a Ni-64 target using an 18MeV proton energy beam was developed. The studies on the optimisation of targetry for the 18 MeV proton bombardments were performed in terms of the cost-effective target utilisation and purity of the 64CU product. The thickness-specific Cu-64 yield (mu Ci/mu A x mu m) was introduced into the optimisation calculation with respect to cost-effective target utilisation. A maximum target utilisation efficacy factor (TUE) was found for the proton energy range of 2.5-13 MeV with corresponding target thickness of 36.2 mu m. With the optimised target thickness and proton energy range, the Ni-64 target thickness saving of 45.6% was achieved, while the overall Cu-64 yield loss is only 23.9%, compared to the use of the whole effective proton energy range of 0-18 MeV with target thickness of 66.6 mu m. This optimisation has the advantage of reducing the target amount to a reasonable level, and therefore the cost of the expensive Ni-64 target material. The Ni-64 target electroplated on the Au-Tl multi layer coated Cu-substrate was a new and competent design for an economic production of high quality Cu-64 radioisotope using an 18 MeV proton energy cyclotron or a 30 MeV cyclotron with proton beam adjustable to IS MeV. In this design, the Au coating layer plays a role of protection of cold Cu leakage from the Cu substrate and Tl serves to depress the proton beam energy (from 18 MeV to the energy optimised value 13 MeV). The ion exchange chromatographic technique with a gradient elution was applied to improve the Cu-64 separation with respect to reducing the processing time and control of Cu-64 product quality. Crown Copyright (c) 2009 Published by Elsevier Ltd. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available