In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures
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Title
In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures
Authors
Keywords
Stress Intensity Factor, Homologous Temperature, Transmission Electron Microscopy Technique, Nanocrystalline Nickel, Notch Stress Intensity Factor
Journal
JOM
Volume 67, Issue 8, Pages 1713-1720
Publisher
Springer Nature
Online
2015-05-30
DOI
10.1007/s11837-015-1459-8
References
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