In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures

Title
In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures
Authors
Keywords
Stress Intensity Factor, Homologous Temperature, Transmission Electron Microscopy Technique, Nanocrystalline Nickel, Notch Stress Intensity Factor
Journal
JOM
Volume 67, Issue 8, Pages 1713-1720
Publisher
Springer Nature
Online
2015-05-30
DOI
10.1007/s11837-015-1459-8

Ask authors/readers for more resources

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now