The origin of white luminescence from silicon oxycarbide thin films

High-resolution electron spin resonance analysis of ion bombardment induced defects in advanced low-κ insulators (κ = 2.0-2.5)

(2013) V. V. Afanas'ev et al.   APPLIED PHYSICS LETTERS

A review of recent progress in lasers on silicon

(2012) Zhou Fang et al.   OPTICS AND LASER TECHNOLOGY

Thermal annealing effects on photoluminescence properties of carbon-doped silicon-rich oxide thin films implanted with erbium

(2011) Vasileios Nikas et al.   JOURNAL OF APPLIED PHYSICS

Carbon in silica

(2011) V. A. Radzig et al.   KINETICS AND CATALYSIS

White light emission from amorphous silicon oxycarbide (a-SiCxOy) thin films: Role of composition and postdeposition annealing

(2010) Spyros Gallis et al.   APPLIED PHYSICS LETTERS

Recent progress in lasers on silicon

(2010) Di Liang et al.   Nature Photonics

EPR study of carbon and silicon related defects in carbon-rich hydrogenated amorphous silicon-carbon films

(2010) E. N. Kalabukhova et al.   PHYSICAL REVIEW B

On the effects of thermal treatment on the composition, structure, morphology, and optical properties of hydrogenated amorphous silicon-oxycarbide

(2009) Spyros Gallis et al.   JOURNAL OF MATERIALS RESEARCH