Experimental evidence on removing copper and light-induced degradation from silicon by negative charge

Published 2014 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Experimental evidence on removing copper and light-induced degradation from silicon by negative charge
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 105, Issue 18, Pages 182108
Publisher
AIP Publishing
Online
2014-11-08
DOI
10.1063/1.4901533
References
View 2 related references

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.