Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry

Title
Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 23, Pages 233503
Publisher
AIP Publishing
Online
2014-06-12
DOI
10.1063/1.4883228

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